Automatic TFT-LCD Mura Defect Detection using Gabor Wavelet Transform and DCT

Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet transform to eliminate texture information in images. Then, we extract mura defect regions from the difference image between gabor wavelet transform image of original panel and generated reference panel image. Finally, all mura defect regions are quantified to detect accurate mura defects. Experimental results show that our method is more accurate and efficient than previous methods. Keyword : Mura defects, LCD inspection, automatic optical inspection, TFT-LCD, DCT. 특집논문 (Special Paper) 방송공학회논문지 제18권 제4호, 2013년 7월 (JBE Vol. 18, No. 4, July 2013) http://dx.doi.org/10.5909/JBE.2013.18.4.525 ISSN 2287-9137 (Online) ISSN 1226-7953 (Print) 526 방송공학회논문지 제18권 제4호, 2013년 7월 (JBE Vol. 18, No. 4, July 2013)